发明名称 Scan chains for out-of-order load/store execution control
摘要 Scan logic which tracks the relative age of stores with respect to a particular load (or of loads with respect to a particular store) allows at processor to hold younger stores until the completion of older loads (or to hold younger loads until completion of older stores). Embodiments of propagate-kill style lookahead scan logic or of tree-structured, hierarchically-organized scan logic constructed in accordance with the present invention provide store older and load older indications with very few gate delays, even in processor embodiments adapted to concurrently evaluate large numbers of operations. Operating in conjunction with the scan logic, address matching logic allows the processor to more precisely tailor its avoidance of load-store (or store-load) dependencies. In a processor having a load unit and a store unit, a load/store execution control system allows load and store instructions to execute generally out-of-order with respect to each other while enforcing data dependencies between the load and store instructions.
申请公布号 US6038657(A) 申请公布日期 2000.03.14
申请号 US19980040087 申请日期 1998.03.17
申请人 ADVANCED MICRO DEVICES, INC. 发明人 FAVOR, JOHN G.;BEN-MEIR, AMOS;STAPLETON, WARREN G.;TRULL, JEFFREY E.;ROBERTS, MARK E.
分类号 G06F7/74;G06F9/30;G06F9/318;G06F9/38;G06F9/455;G06F9/48;(IPC1-7):G06F9/312 主分类号 G06F7/74
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