发明名称 |
ULTRASHORT-PULSE HIGH-VOLTAGE GENERATION APPARATUS USED FOR SCANNING PROBE MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To obtain an ultrashort-pulse high-voltage generation apparatus by which high-voltage ultrashort pulses, at 1 ns or lower, whose electric charge amount is controlled can be applied to a probe. SOLUTION: A very small capacity part 16 which is composed of a metal pole plate and an insulator is installed near a probe 4. A power-supply unit 2 for high-voltage ultarshort pulses is provided with a high-voltage charging and discharge circuit which is matched in impedance with a main coaxial cable 14 and which can be changed over to a positive voltage and a negative voltage. A center conductor 14A to which a high voltage is applied at the tip of the main coaxial cable 14 is connected to a metal pole plate 17 of the very small capacity part 16 which is insulated from the probe 4. A positive electric charge which is stored in the metal pole plate 17 of the very small capacity part 16 is discharged. A negative electric charge which is stored in the other electrode which is connected electrically to the probe 4 is applied to the probe 4. Alternatively, the negative electric charge which is stored is discharged inversely, and the positive electric charge is applied to the probe 4.
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申请公布号 |
JP2000074930(A) |
申请公布日期 |
2000.03.14 |
申请号 |
JP19980242991 |
申请日期 |
1998.08.28 |
申请人 |
MORI YUZO;JAPAN SCIENCE & TECHNOLOGY CORP;JEOL LTD |
发明人 |
MORI YUZO;TSUTSUMI KENICHI;IWATSUKI MASASHI |
分类号 |
G01N23/225;G01N23/227;G01N37/00;G01Q30/02;G01Q60/10;G01Q60/16;G01Q90/00;H01J37/30;(IPC1-7):G01N37/00 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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