发明名称 High-voltage device substrate structure and method of fabrication
摘要 A method for fabricating a high-voltage device substrate comprising the steps of forming a pad oxide layer and a mask layer over a substrate. Then, the pad oxide layer and the mask layer are patterned to define a region for a first ion implantation. Next, the exposed substrate is oxidized to form a field oxide layer. Thereafter, the mask layer is removed followed by a first ion implantation. Next, a portion of the field oxide layer is removed, and then a second ion implantation is performed implanting ions into the exposed substrate. Then, a conformal oxide layer is formed over the substrate surface. Next, a high temperature drive-in and oxidation operation is carried out, in which ions in the first ion implanted region and the second ion implanted region are driven deeper into the substrate interior, and at the same time the substrate above those regions are oxidized. Finally, the oxide layer on the substrate surface is removed, and then an epitaxial layer is formed over the substrate.
申请公布号 US6037229(A) 申请公布日期 2000.03.14
申请号 US19980104135 申请日期 1998.06.24
申请人 UNITED MICROELECTRONICS CORP. 发明人 LEE, JIA-SHENG
分类号 H01L21/225;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/225
代理机构 代理人
主权项
地址