发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can improve both the operation speed and the level of integration by providing a source/drain electrode made of metal silicide and adopting a self-aligned contact without a dry etching stopper film. SOLUTION: A source/drain electrode 10 made of metal silicide is provided to a source and drain 9 in a field effect transistor. Then, a polycrystalline silicon film 4, a metallic gate electrode 5, a cap 6 and an insulation film 8 are formed on an element isolation region 2, forming a dummy gate which does not function as a transistor. The polycrystalline silicon film 4 and metallic gate electrode 5 of the dummy gate are made as a gate-like electrode which does not function as a gate. Thus, the parastic resistance of the source and drain 9 is decreased, resulting in high-speed operation of a MOSFET. Furthermore, the element can be made smaller in area and the arranging pitch be also made small, thereby reducing the parastic capacity and sharply enhancing level integration.
申请公布号 JP2000077535(A) 申请公布日期 2000.03.14
申请号 JP19980248498 申请日期 1998.09.02
申请人 HITACHI LTD 发明人 SHIBA TAKEO;ONOUCHI YUKIHIRO;UCHINO TAKASHI;UMEDA KAZUNORI;ONISHI KAZUHIRO
分类号 H01L29/78;H01L21/28;H01L21/336;H01L21/8234;H01L27/088;(IPC1-7):H01L21/823 主分类号 H01L29/78
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