发明名称 |
Vision aided docking mechanism for semiconductor testers |
摘要 |
An integrated circuit tester for a test board which has a visual target. The tester includes a test arm that can be electrically coupled to the test board and a movement mechanism that can move the arm relative to the board. The tester further includes a camera that is mounted to the test arm. The camera provides a visual image of the visual target which is used to align the test arm with the test board.
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申请公布号 |
US6037791(A) |
申请公布日期 |
2000.03.14 |
申请号 |
US19970905226 |
申请日期 |
1997.08.01 |
申请人 |
INTEL CORPORATION |
发明人 |
YAP, HOON-YENG;FAVA, JOHN;OGURCHAK, KEVIN;AAGAARD, ANDY |
分类号 |
G01R31/28;(IPC1-7):G01R1/06 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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