发明名称 ABRASIVE SLURRY AND POLISHING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To perform chemical mechanical polishing(CMP) of an organic film represented by CFx by using an oxidizing agent for organic film and abrasive slurry containing abrasive grains. SOLUTION: Abrasive slurry 14 containing oxidizing agent and abrasive grains is employed. It may be added with a pH conditioning agent. The oxidizing agent causes chemical reaction on an organic film W1 and includes acid oxidizing agent, e.g. H2O2 (hydrogen peroxide water), Fe(NO3)3 (iron(II) nitrate), KIO3 (potassium iodate), and alkaline oxidizing agent, e.g. KOH (potassium hydroxide), amine based salt such as hydrochloride amine or monoethanol amine, peroxo based compound. The peroxo based compound contains peroxonitrate, peroxocarbonate, peroxo titanic acid, and peroxotitanate.</p>
申请公布号 JP2000077365(A) 申请公布日期 2000.03.14
申请号 JP19980259279 申请日期 1998.08.29
申请人 TOKYO ELECTRON LTD 发明人 IWASHITA MITSUAKI;ISHIKAWA HIROSHI
分类号 B24B37/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
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