发明名称 TEMPORARY TABLE FOR BATCH WAFERS AND WAFER CHUCKING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a temporary table for attaching/detaching batch wafers that can vacuum uniformly in the vacuum chuck mechanism of a polishing device without failure. SOLUTION: This temporary table for batch wafers has an index table having a plurality of wafer vacuum plates 161 concentrically provided at regular intervals (A), a hollow shaft 163 that bears the central point of the index table and can horizontally rotate the index table (B), a washing solution supply table 162 borne by this hollow shaft 163 and provided at a higher position than the upper surface of the index table to supply a washing solution to a plurality of wafer vacuum plates (C), a pipe provided in the hollow shaft 163 to supply fluid to the plurality of wafer vacuum plates 161 and discharge fluid from the wafer vacuum plates 161 (D), and a pipe provided in the hollow shaft 163 to supply a washing solution to the washing solution supply table 162.</p>
申请公布号 JP2000077367(A) 申请公布日期 2000.03.14
申请号 JP19980259154 申请日期 1998.08.31
申请人 OKAMOTO MACHINE TOOL WORKS LTD 发明人 KOBAYASHI KAZUO;SAKO YAMATO;IDE SATORU;KOSUGE RYUICHI;KIDA HIROAKI
分类号 H01L21/683;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 主分类号 H01L21/683
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