发明名称 |
TEMPORARY TABLE FOR BATCH WAFERS AND WAFER CHUCKING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a temporary table for attaching/detaching batch wafers that can vacuum uniformly in the vacuum chuck mechanism of a polishing device without failure. SOLUTION: This temporary table for batch wafers has an index table having a plurality of wafer vacuum plates 161 concentrically provided at regular intervals (A), a hollow shaft 163 that bears the central point of the index table and can horizontally rotate the index table (B), a washing solution supply table 162 borne by this hollow shaft 163 and provided at a higher position than the upper surface of the index table to supply a washing solution to a plurality of wafer vacuum plates (C), a pipe provided in the hollow shaft 163 to supply fluid to the plurality of wafer vacuum plates 161 and discharge fluid from the wafer vacuum plates 161 (D), and a pipe provided in the hollow shaft 163 to supply a washing solution to the washing solution supply table 162.</p> |
申请公布号 |
JP2000077367(A) |
申请公布日期 |
2000.03.14 |
申请号 |
JP19980259154 |
申请日期 |
1998.08.31 |
申请人 |
OKAMOTO MACHINE TOOL WORKS LTD |
发明人 |
KOBAYASHI KAZUO;SAKO YAMATO;IDE SATORU;KOSUGE RYUICHI;KIDA HIROAKI |
分类号 |
H01L21/683;H01L21/304;H01L21/68;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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