发明名称 Sputter deposition and annealing of copper alloy metallization
摘要 Copper and a small amount of an alloying metal such as magnesium or aluminum are cosputtered onto a substrate having oxide on at least a portion of its surface. Either the wafer is held at an elevated temperature during deposition or the sputtered film is annealed without the wafer being exposed to ambient. Due to the high temperature, the alloying metal diffuses to the surface. If a surface is exposed to a low partial pressure of oxygen or contacts silicon dioxide, the magnesium or aluminum forms a thin stable oxide. The alloying metal oxide encapsulates the copper layer to provide a barrier against copper migration, to form an adhesion layer over silicon dioxide, and to act as a seed layer for the later growth of copper, for example, by electroplating.
申请公布号 US6037257(A) 申请公布日期 2000.03.14
申请号 US19970853191 申请日期 1997.05.08
申请人 APPLIED MATERIALS, INC. 发明人 CHIANG, TONY;DING, PEIJUN;CHIN, BARRY;HASHIM, IMRAN;SUN, BINGXI
分类号 C23C14/02;C23C14/16;C23C16/02;C23C16/06;H01L21/285;H01L21/768;H01L23/532;(IPC1-7):H01L21/476;H01L21/44;H01L23/48 主分类号 C23C14/02
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