发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a manufacture thereof capable of finely patterning a polycrystalline silicon film without a portion not being left, and of easily preventing dielectric strength between an erasable electrode and a floating gate electrode. SOLUTION: The manufacture of a semiconductor memory device includes a process of forming a floating gate electrode 15 by etching away a conductive film 8 with the use of a sidewall insulating film 14 along the side of a control gate electrode 13, as a mask is constituted by anisotropically dry-etching the conductive film 8 under the condition of a high selective etching ratio to an oxide film and then by wet-etching it with an ammonia solution. This semiconductor memory device has a feature in which a trench 19 is formed in a device- isolating insulating film 6 exposed to the side of the floating gate electrode 15.
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申请公布号 |
JP2000077545(A) |
申请公布日期 |
2000.03.14 |
申请号 |
JP19980246856 |
申请日期 |
1998.09.01 |
申请人 |
MATSUSHITA ELECTRONICS INDUSTRY CORP |
发明人 |
NORO FUMIHIKO;EGASHIRA KYOKO |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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