发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a manufacture thereof capable of finely patterning a polycrystalline silicon film without a portion not being left, and of easily preventing dielectric strength between an erasable electrode and a floating gate electrode. SOLUTION: The manufacture of a semiconductor memory device includes a process of forming a floating gate electrode 15 by etching away a conductive film 8 with the use of a sidewall insulating film 14 along the side of a control gate electrode 13, as a mask is constituted by anisotropically dry-etching the conductive film 8 under the condition of a high selective etching ratio to an oxide film and then by wet-etching it with an ammonia solution. This semiconductor memory device has a feature in which a trench 19 is formed in a device- isolating insulating film 6 exposed to the side of the floating gate electrode 15.
申请公布号 JP2000077545(A) 申请公布日期 2000.03.14
申请号 JP19980246856 申请日期 1998.09.01
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 NORO FUMIHIKO;EGASHIRA KYOKO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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