| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device of electronic parts which is superior in temperature raising performance of electronic parts under testing. SOLUTION: This device 1 is constituted to carry in test trays TST loading electronic parts IC to be tested into a chamber part, test them after impressing a specific thermal stress to the electronic parts, deliver the test trays out of the chamber and classify according to the test results. In this case, heaters H are provided to the rails 110 and 111 directly or indirectly in contact with the test trays.
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