发明名称 |
FORMATION OF RESIST PATTERN AND PRODUCTION OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To precisely form a projecting-type opening suitable for lift-off in resist films. SOLUTION: A lower layer resist film 2 is coated and exposed to light, then a mixing-preventing layer 3 is provided on the lower resist layer 2. Au upper resist layer 4 is coated on the mixing-preventing layer 3 and exposed to light. Afterward, the upper layer resist film 4, the mixing preventing layer 3 and the lower resist layer 2 are successively developed and removed to form an opening 8c having a projecting-type cross section. |
申请公布号 |
JP2000075498(A) |
申请公布日期 |
2000.03.14 |
申请号 |
JP19980243816 |
申请日期 |
1998.08.28 |
申请人 |
FUJITSU LTD;FUJITSU QUANTUM DEVICE KK |
发明人 |
NONAKA YASUNORI;MAKIYAMA KOZO;ENDO HIROSHI |
分类号 |
G03F7/26;H01L21/027;H01L21/28;H01L21/306;(IPC1-7):G03F7/26 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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