发明名称 FORMATION OF RESIST PATTERN AND PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To precisely form a projecting-type opening suitable for lift-off in resist films. SOLUTION: A lower layer resist film 2 is coated and exposed to light, then a mixing-preventing layer 3 is provided on the lower resist layer 2. Au upper resist layer 4 is coated on the mixing-preventing layer 3 and exposed to light. Afterward, the upper layer resist film 4, the mixing preventing layer 3 and the lower resist layer 2 are successively developed and removed to form an opening 8c having a projecting-type cross section.
申请公布号 JP2000075498(A) 申请公布日期 2000.03.14
申请号 JP19980243816 申请日期 1998.08.28
申请人 FUJITSU LTD;FUJITSU QUANTUM DEVICE KK 发明人 NONAKA YASUNORI;MAKIYAMA KOZO;ENDO HIROSHI
分类号 G03F7/26;H01L21/027;H01L21/28;H01L21/306;(IPC1-7):G03F7/26 主分类号 G03F7/26
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