发明名称 Method of fabricating self-aligned contact window which includes forming a undoped polysilicon spacer that extends into a recess of the gate structure
摘要 A method of fabricating a self-aligned contact window is described. A gate oxide layer, a conductive layer, a first oxide layer and an undoped polysilicon layer are successively formed on a substrate. These layers above are patterned to form a gate structure. A water clean step is performed, producing a recess in the first oxide layer. A second oxide layer is thermally formed on the surface of the gate structure. An undoped polysilicon spacer is formed on the sidewall of the gate structure and a portion of the undoped polysilicon spacer extends into the recess of the first oxide layer. A dielectric layer is formed over the substrate and using the undoped polysilicon spacer as an etching stop, a self-aligned contact window is formed to expose the source/drain region.
申请公布号 US6037228(A) 申请公布日期 2000.03.14
申请号 US19990249501 申请日期 1999.02.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSU, SHIH-YING
分类号 H01L21/60;(IPC1-7):H01L21/823;H01L21/336;H01L21/320;H01L29/76;H01L27/088 主分类号 H01L21/60
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