发明名称 METHOD FOR EVALUATING SERVICE LIFE OF CATHODE-RAY TUBE
摘要 PROBLEM TO BE SOLVED: To precisely judge the service life of a cathode-ray tube in a short time by performing an acceleration test, in a state where the quantity of getter of a test cathode-ray tube manufactured for evaluation is set less than a regulated quantity, and estimating the life of a generally manufactured cathode-ray tube from this result. SOLUTION: A cathode-ray tube 1 is manufactured with various gettering quantities, for example, 5 mg, 10 mg, 15 mg and the like, and a service life test is performed with respect to each cathode-ray tube. The getter scattering quantity is determined on the basis of the weight measured before a getter 10 is mounted on the cathode-ray tube 1 by measuring the weight of the getter 10 in the cathode-ray tube 1 after the service life test. Namely, the difference between the weight after the service life test and the weight before mounted on the cathode-ray tube 1 corresponds to the quantity of the scattered getter. Thereafter, the correlation between the getter scattering quantity and the lifetime is determined from this data. Next, the getter quantity as reaches the service life in a prescribed time is selected, and a cathode-ray tube which is manufactured according to this getter quantity is used for the acceleration test.
申请公布号 JP2000076999(A) 申请公布日期 2000.03.14
申请号 JP19980247550 申请日期 1998.09.01
申请人 SONY CORP 发明人 SASAYAMA NOBUO;MAKINO TETSUHIKO
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
代理机构 代理人
主权项
地址