Electronic component separation device e.g. for IC testing device, has individual component fed through discharge opening in feed rail and received in slot of perpendicular feed device

摘要

The component separation device has a feed rail (11) receiving a number of electronic components (24,25,26) positioned one after the other and a feed device (17) displaced perpendicular to the feed rail, with a reception slot (27) for receiving a single component via an outlet opening (43) in the feed rail.