发明名称 Protected epitaxially coated semiconductor wafers are produced using a central clean room chamber for integration of epitaxial layer and protective layer forming operations
摘要 Protected epitaxially coated semiconductor wafer production, by wafer transfer from a central clean room chamber to an epitaxy reactor and then to a protective layer forming oxidation furnace or CVD reactor, is new. Production of an epitaxially coated semiconductor wafer with a protective layer comprises: (i) loading an epitaxy reactor with wafers from a central clean room chamber; (ii) depositing epitaxial layers on the wafers; (iii) transferring the wafer into the central chamber; (iv) loading an oxidation furnace or a CVD reactor with the wafers to form the protective layer; and (v) transferring the wafers into the central chamber. An Independent claim is also included for an apparatus for carrying out the above process.
申请公布号 DE19839023(A1) 申请公布日期 2000.03.09
申请号 DE1998139023 申请日期 1998.08.27
申请人 WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG 发明人 BAUER-MAYER, SUSANNE;HANSSON, PER-OVE
分类号 C30B33/00;H01L21/205;H01L21/316;(IPC1-7):H01L21/30;F24F1/04 主分类号 C30B33/00
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