发明名称 |
Method of performing an extensive diagnostic test in conjunction with a bios test routine |
摘要 |
A BIOS testing routine is initiated. Control is transferred to a diagnostic routine. The diagnostic routine performs a series of test in which a plurality of components are examined. In one embodiment, a random access/random data memory test is performed on a block of memory. Subsequently, control is transferred to the BIOS testing routine.
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申请公布号 |
US6035420(A) |
申请公布日期 |
2000.03.07 |
申请号 |
US19970942463 |
申请日期 |
1997.10.01 |
申请人 |
MICRON ELECTRONICS, INC. |
发明人 |
LIU, JI-HWAN;STARR, LOWELL;WU, WEI |
分类号 |
G06F11/22;G11C29/08;(IPC1-7):G06F12/14 |
主分类号 |
G06F11/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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