发明名称 Method of performing an extensive diagnostic test in conjunction with a bios test routine
摘要 A BIOS testing routine is initiated. Control is transferred to a diagnostic routine. The diagnostic routine performs a series of test in which a plurality of components are examined. In one embodiment, a random access/random data memory test is performed on a block of memory. Subsequently, control is transferred to the BIOS testing routine.
申请公布号 US6035420(A) 申请公布日期 2000.03.07
申请号 US19970942463 申请日期 1997.10.01
申请人 MICRON ELECTRONICS, INC. 发明人 LIU, JI-HWAN;STARR, LOWELL;WU, WEI
分类号 G06F11/22;G11C29/08;(IPC1-7):G06F12/14 主分类号 G06F11/22
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