发明名称 |
Method of making high voltage metal oxide silicon field effect transistor |
摘要 |
A manufacturing method of high voltage MOSFET includes a process forming the first and second conductive wells in a semiconductor substrate; process forming drift areas in the first and second conductive wells; process growing an isolation membrane on the substrate surface between the first and second conductive wells; process forming a gate insulation film; process forming a gate on the gate insulation film above the first and second conductive wells; process forming low concentration n-and p-type dopant areas in the drift areas of the parts adjacent to the gate; process forming buried diffusion areas in the first and second conductive wells; process forming source/drain having a body contact on a side on the buried diffusion areas in the first and second conductive wells; process forming an insulation film having a contact formed in such way that is exposed the surface of source/drain on the entire surface of the substrate including the gate and isolation membrane; process forming a metal film on the insulation film; and process forming source/drain electrodes and the metal field plates, by etching the metal film using a mask.
|
申请公布号 |
US6033948(A) |
申请公布日期 |
2000.03.07 |
申请号 |
US19980178516 |
申请日期 |
1998.10.26 |
申请人 |
LG SEMICON CO., LTD. |
发明人 |
KWON, O-KYONG;JEONG, HOON-HO |
分类号 |
H01L21/336;H01L21/8238;H01L27/092;H01L29/06;H01L29/10;H01L29/40;H01L29/78;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|