发明名称 PAD AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A manufacturing method of pad is provided to prevent a decrease of a threshold voltage of a transistor in a semiconductor substrate. CONSTITUTION: The pad manufacturing method comprises the steps of: forming a conductive pattern of which an upper surface and both sides are surrounded by a first insulation layer in the semiconductor substrate; forming a second insulation layer having an etching rate with the first insulation layer on the substrate including the conductive pattern; forming an opening exposing an upper surface of the substrate between the conductive patterns by selectively etching the second insulation layer; forming a prevention layer on the sidewalls of the opening for preventing a material diffusion from the second insulation layer to the lower part of the opening; and forming a pad electrically connected to the semiconductor substrate by filling up the opening with the second conductive layer.
申请公布号 KR20000013404(A) 申请公布日期 2000.03.06
申请号 KR19980032245 申请日期 1998.08.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YUN JAE;LEE, WON SEONG
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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