发明名称 |
PAD AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A manufacturing method of pad is provided to prevent a decrease of a threshold voltage of a transistor in a semiconductor substrate. CONSTITUTION: The pad manufacturing method comprises the steps of: forming a conductive pattern of which an upper surface and both sides are surrounded by a first insulation layer in the semiconductor substrate; forming a second insulation layer having an etching rate with the first insulation layer on the substrate including the conductive pattern; forming an opening exposing an upper surface of the substrate between the conductive patterns by selectively etching the second insulation layer; forming a prevention layer on the sidewalls of the opening for preventing a material diffusion from the second insulation layer to the lower part of the opening; and forming a pad electrically connected to the semiconductor substrate by filling up the opening with the second conductive layer.
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申请公布号 |
KR20000013404(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980032245 |
申请日期 |
1998.08.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YUN JAE;LEE, WON SEONG |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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地址 |
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