MEMORY INTEGRATED CIRCUIT HAVING SERIAL OUTPUT COMPARATOR

摘要

PURPOSE: A memory integrated circuit is provided to test data of a high frequency memory integrated circuit using a low frequency testing device by comparing, coding, and generating high-speed data inwardly generated in series. CONSTITUTION: The circuit comprises a plurality of switches inputting internal data and outputting the internal data in response to a control signal, a plurality of preservers preserving outputs of the switches by respectively inputting the outputs, a comparator comparing the internal data and the outputs of the data preserves, and a data transmitter transmitting the internal data to the switches in response to an internal clock signal.