BUILT IN SELF TEST DEVICE USING LINEAR FEEDBACK SHIFT REGISTER

摘要

PURPOSE: A built in self test(BIST) device using linear feedback shift register(LFSR) is provided to reduce a over-head of test circuit on a chip including a few LFSRs and multiple input linear feedback shift registers(MISR) and using an internal memory. CONSTITUTION: The BIST device using LFSR comprises a test pattern generator, a data compressor and a controller. In the BIST device using LFSR, the test pattern generator includes a first shift chain with a first part of memory and operates a primitive polynomial and generates a pseudo-random pattern and supplies the pseudo-random pattern to a plurality of functional blocks. The data compressor includes a second shift chain with a second part of memory and compress a data from the functional block and outputs a compressed data. The controller generates a control signal to control the data compressor.