发明名称 |
TiN NITRITE FILM FORMING METHOD |
摘要 |
PURPOSE: A TiN film is provided which prevents diffusion excellently. CONSTITUTION: A TiN film with a columnar structural crystal grain is formed through the CVD method. And a TiN film with a crossing isotropic crystal grain is formed on the TiN additionally. Then a condition gas is provided, which is the same gas as is provided in the formation of the first TiN film, in different quantity from that of the first. Consequentially, a void (C) which is a diffusion path is not linked and the diffusion quality of the TiN film is improved because of an interface (I) between the two TiN films.
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申请公布号 |
KR20000014184(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980033446 |
申请日期 |
1998.08.18 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
CHE, MU-SUNG;KIM, JEONG-TAE |
分类号 |
H01L21/318;(IPC1-7):H01L21/318 |
主分类号 |
H01L21/318 |
代理机构 |
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地址 |
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