发明名称 TiN NITRITE FILM FORMING METHOD
摘要 PURPOSE: A TiN film is provided which prevents diffusion excellently. CONSTITUTION: A TiN film with a columnar structural crystal grain is formed through the CVD method. And a TiN film with a crossing isotropic crystal grain is formed on the TiN additionally. Then a condition gas is provided, which is the same gas as is provided in the formation of the first TiN film, in different quantity from that of the first. Consequentially, a void (C) which is a diffusion path is not linked and the diffusion quality of the TiN film is improved because of an interface (I) between the two TiN films.
申请公布号 KR20000014184(A) 申请公布日期 2000.03.06
申请号 KR19980033446 申请日期 1998.08.18
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 CHE, MU-SUNG;KIM, JEONG-TAE
分类号 H01L21/318;(IPC1-7):H01L21/318 主分类号 H01L21/318
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