发明名称 SEMICONDUCTOR DEVICE WITH ALIGN KEY
摘要 PURPOSE: A semiconductor device with align key is provided to reduce a loss time for measurement of align degree and easily analysis an align degree for plurality of succeeding align keys using a plurality of succeeding align keys inside/outside of a specific align key. CONSTITUTION: The semiconductor device with align key comprises a first align key, and a group of align key with overlapped succeeding align keys. In the semiconductor device with align key, the first align key is formed on a scribe line by a selected photo etching process in a plurality of photo etching process. The group of align key with overlapped succeeding align keys are formed around the first align key by a selected succeeding photo etching process in the plurality of photo etching process.
申请公布号 KR20000014110(A) 申请公布日期 2000.03.06
申请号 KR19980033322 申请日期 1998.08.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, TAE SHIN
分类号 H01L21/027;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/027
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