发明名称 |
SEMICONDUCTOR DEVICE WITH ALIGN KEY |
摘要 |
PURPOSE: A semiconductor device with align key is provided to reduce a loss time for measurement of align degree and easily analysis an align degree for plurality of succeeding align keys using a plurality of succeeding align keys inside/outside of a specific align key. CONSTITUTION: The semiconductor device with align key comprises a first align key, and a group of align key with overlapped succeeding align keys. In the semiconductor device with align key, the first align key is formed on a scribe line by a selected photo etching process in a plurality of photo etching process. The group of align key with overlapped succeeding align keys are formed around the first align key by a selected succeeding photo etching process in the plurality of photo etching process.
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申请公布号 |
KR20000014110(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980033322 |
申请日期 |
1998.08.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, TAE SHIN |
分类号 |
H01L21/027;H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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