发明名称 |
MANUFACTURING METHOD OF STATIC RANDOM ACCESS MEMORY DEVICE |
摘要 |
PURPOSE: A manufacturing method of SRAM(Static Random Access Memory) device is provided to reduce a step difference and simplify a manufacturing process by making a plurality of overlapped contact holes at a time. CONSTITUTION: The manufacturing method comprises the steps of: forming a gate insulation layer on a semiconductor substrate in which an active region is defined; forming a gate after evaporating and patterning a first conduction layer; sequentially evaporating a first insulation layer and a second conduction layer on the gate insulation layer; forming a gate of a thin film transistor by patterning the second conduction layer; forming a second insulation layer which is used as a gate insulation layer of the thin film transistor on the second conduction layer including the gate of a thin film transistor; forming a contact hole exposing the second, first conduction layers and active region by etching the second and first insulation layer; and forming a channel of the thin film transistor by evaporating and patterning a third conduction layer on the second insulation layer including the contact hole.
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申请公布号 |
KR20000013468(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980032337 |
申请日期 |
1998.08.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEONG, U YEONG |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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