发明名称 |
FLASH NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE FOR PREVENTING AN OVER-ERASE |
摘要 |
PURPOSE: A flash non-volatile semiconductor memory device is provided to prevent error data caused by an over-erased memory cell without increasing a memory size. CONSTITUTION: The flash non-volatile semiconductor memory device comprises: a first lengthy diffusion area elongated along a column direction on a surface area of a semiconductor substrate; a plurality of channel regions on the surface area which elongates from one edge of the first diffusion area to a row direction, the channel regions being composed of a first channel region and a second channel region adjoining the edge of the first diffusion area; a floating gate layers on the first channel region by inserting a thin insulation layer; a gate insulation layer on the second channel regions; a control gate layer on the floating gate layers and the gate insulation layer by inserting a interlayer dielectric layer; a second diffusion area within the surface area between the adjoining second channel regions; and a conduction layer which is insulated from the control gate layers, contacts the second diffusion area and elongates along the column direction.
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申请公布号 |
KR20000013791(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980032859 |
申请日期 |
1998.08.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOE, JEONG HYEOK |
分类号 |
H01L21/28;H01L27/115;H01L29/788;(IPC1-7):G11C16/04 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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