发明名称 FLASH NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE FOR PREVENTING AN OVER-ERASE
摘要 PURPOSE: A flash non-volatile semiconductor memory device is provided to prevent error data caused by an over-erased memory cell without increasing a memory size. CONSTITUTION: The flash non-volatile semiconductor memory device comprises: a first lengthy diffusion area elongated along a column direction on a surface area of a semiconductor substrate; a plurality of channel regions on the surface area which elongates from one edge of the first diffusion area to a row direction, the channel regions being composed of a first channel region and a second channel region adjoining the edge of the first diffusion area; a floating gate layers on the first channel region by inserting a thin insulation layer; a gate insulation layer on the second channel regions; a control gate layer on the floating gate layers and the gate insulation layer by inserting a interlayer dielectric layer; a second diffusion area within the surface area between the adjoining second channel regions; and a conduction layer which is insulated from the control gate layers, contacts the second diffusion area and elongates along the column direction.
申请公布号 KR20000013791(A) 申请公布日期 2000.03.06
申请号 KR19980032859 申请日期 1998.08.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOE, JEONG HYEOK
分类号 H01L21/28;H01L27/115;H01L29/788;(IPC1-7):G11C16/04 主分类号 H01L21/28
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