发明名称 CONTACT FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A contact forming method of semiconductor device is provided to reduce a contact resistor between a pad poly and a buried contact. CONSTITUTION: An interlayer insulating layer is etched down to a top surface of a conductive layer pattern to form a contact hole. The conductive layer pattern is isotropically etched to increase surface area of the exposed conductive layer pattern. A contact plug is formed by filling the contact hole with a conductive material to contact with the conductive layer pattern. Thereby, it is possible to increase contact area between the conductive layer pattern and the contact plug electrically contacted with the conductive layer pattern.</p>
申请公布号 KR20000013552(A) 申请公布日期 2000.03.06
申请号 KR19980032460 申请日期 1998.08.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JIN, GYO YEONG
分类号 H01L21/28;H01L21/311;H01L21/768;H01L21/8242;H01L23/522;(IPC1-7):H01L21/28 主分类号 H01L21/28
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