发明名称 |
SELF ALIGNED CONTACT AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A self aligned contact fabricating method is provided to prevent a short fail by a misalignment by forming a self aligned contact pad with two layers so as to be self-aligned with a gate electrode and a bit line. CONSTITUTION: In the self aligned contact fabricating method, on a first insulation layer and a first self aligned contact pad (106) formed on a semiconductor substrate (100) is formed a second insulation layer. A conductive structure is formed on the second insulation layer so as to be surrounded by a material layer having an etch selective rate with the second insulation layer. A second self aligned contact pad (118) is formed at both sides of the conductive structure so as to be connected with the first self aligned contact pad (106).
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申请公布号 |
KR20000013308(A) |
申请公布日期 |
2000.03.06 |
申请号 |
KR19980032086 |
申请日期 |
1998.08.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, BYUNG JUN |
分类号 |
H01L23/522;H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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