发明名称 SELF ALIGNED CONTACT AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A self aligned contact fabricating method is provided to prevent a short fail by a misalignment by forming a self aligned contact pad with two layers so as to be self-aligned with a gate electrode and a bit line. CONSTITUTION: In the self aligned contact fabricating method, on a first insulation layer and a first self aligned contact pad (106) formed on a semiconductor substrate (100) is formed a second insulation layer. A conductive structure is formed on the second insulation layer so as to be surrounded by a material layer having an etch selective rate with the second insulation layer. A second self aligned contact pad (118) is formed at both sides of the conductive structure so as to be connected with the first self aligned contact pad (106).
申请公布号 KR20000013308(A) 申请公布日期 2000.03.06
申请号 KR19980032086 申请日期 1998.08.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, BYUNG JUN
分类号 H01L23/522;H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L23/522
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