| 摘要 |
PURPOSE: A module integration circuit test apparatus is provided to reduce loading and unloading time of module integration circuit(IC) by inserting a module IC into a test socket including a terminal directly. CONSTITUTION: The module IC test apparatus comprises a pair of guide(17) deciding again a location of a plural of a module IC(1) formed and loaded to capable of advancing and retreating to base(14), driver moving the guide in advance and retreat simultaneously, a test socket(16) formed in a directly under direction, for the module IC loaded to conduct with a tester electrically, and a delivering tool formed on a socket block(25) having the test socket, for the module IC loaded in the test socket to be delivered before unloading. The IC module is loaded by a pickup section and inserted in the test socket(16) directly. |
