SEMICONDUCTOR WAFER ID RECOGNIZING METHOD IN WAFER TEST

摘要

PURPOSE: A semiconductor wafer id recognizing method in wafer test is provided to reduce an error of calculated yield by worker directly registers an ID of wafer. CONSTITUTION: The semiconductor wafer id recognizing method in wafer test comprises the steps of loading a wafer in an inspection equipment; displaying an image of wafer ID with a wafer ID; recognizing the wafer ID; selecting the wafer ID; and progressing a run. The inspection equipment enable to process an optical image processing and probably has an optical character recognition(OCR). The inspection equipment is semi-automatic type which worker directly selects the wafer ID.