| 摘要 |
PROBLEM TO BE SOLVED: To make it possible to measure it either gain in the TE mode or the TM mode of a sample to be measured is higher along with the polarization dependence of the sample. SOLUTION: This measuring device deflects light, which has a wide wavelength band emitted from a light source 21 and has a prescribed plane A of linear polarization, into light having a plane B of linear polarization of a mode coincided with the TE mode of a sample S to be measured by a polarizing element 22, adjusts the mode of the plane B to the TE mode and a TM mode of the sample S according to the taking in or out of a 1/2 wavelength constant 23 to make the light incide in the sample S and sample the emitting light take a wavelength spectral measurement by an optical spectrum analyzer 24, whereby it is made possible to measure it either gain of the TE mode and the TM mode is higher and at the same time, it is made possible to measure the polarization dependence of the sample S.
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