发明名称 POSITIVE TYPE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD USING SAME
摘要 PROBLEM TO BE SOLVED: To obtain a positive type resist compsn. excellent in sensitivity and resolution and capable of forming a resist pattern perpendicular to a substrate with a disposed thin film without causing trailing in a cross section and to provide a resist pattern forming method using resist compsn. SOLUTION: An oxo acid of phosphorus or its deriv. is added to a radiation sensitive positive type resist contg. a combination of a resin component whose solubility to an alkaline aq. soln. is increased by the action of an acid and an acid generating component which generates the acid when irradiated to obtain the objective positive type resist compsn. A coating film of the resist compsn. is disposed on a substrate with a disposed thin film, exposed through a mask pattern, heated and developed to form the objective resist pattern.
申请公布号 JP2000066401(A) 申请公布日期 2000.03.03
申请号 JP19980235453 申请日期 1998.08.21
申请人 TOKYO OHKA KOGYO CO LTD 发明人 YUGAWA HIROTO;OMORI KATSUMI;UCHIDA RYUSUKE;SAWAYANAGI YUKIHIRO
分类号 G03F7/039;G03F7/004;G03F7/09;H01L21/027 主分类号 G03F7/039
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