发明名称 Verfahren zur Reparatur von defekten Speicherzellen eines integrierten Speichers
摘要 The invention relates to a method whereby storage cells (MC) are checked one after the other and, immediately after detection of a fault in a checked storage cell, the line feeder (WL) or column feeder (BL) thus concerned is replaced by programming one of the redundant feeders (RWL, RBL). Once a predetermined number of feeders has been programmed, the programming of at least one of the redundant feeders is cancelled when an additional fault is determined. Said redundant feeder (RWL, RBL) is programmed to repair a fault in another storage cell (MC).
申请公布号 DE19838861(A1) 申请公布日期 2000.03.02
申请号 DE19981038861 申请日期 1998.08.26
申请人 SIEMENS AG 发明人 SCHAMBERGER, FLORIAN;SCHNEIDER, HELMUT
分类号 G11C29/44;G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/44
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