发明名称 CONTINUITY TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce labor for wire terminal assembly manufacturing work by providing a probe abutting to a core wire positioned in the center of an insulated wire from the longitudinal direction of the insulated wire in the end of the insulated wire in a continuity test. SOLUTION: A probe 30 is provided with a sharp probe point 32 energized forward by means of a spring toward a base part 31. When a core wire 150 inside an insulating coating 100 of an insulated wire W having a simple cut end to which any special machining is not applied is brought into contact with the probe point 32, the probe point 32 is placed in the substantially center of the base part 31 so as to be positioned in the substantially center to a wire receiving hole 22, while the insulated wire W pressed by the probe point 32 is held stationarily by means of an engaging member 63. In this way, no machining to the end part of the insulated wire W is required for a continuity test, and the tested end part can be applied directly to the following process such as crimping, compressing, and soldering.
申请公布号 JP2000065885(A) 申请公布日期 2000.03.03
申请号 JP19980235090 申请日期 1998.08.21
申请人 AMP JAPAN LTD 发明人 IMAI KOJI
分类号 G01R31/02;H01R43/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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