A TEST METHOD OF HIGH SPEED MEMORY DEVICE IN WHICH LIMIT CONDITIONS TO THE USAGE OF SHIFT CLOCK SIGNAL ARE DEFINED,申请号KR19970029711-传众专利搜索

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发明名称	A TEST METHOD OF HIGH SPEED MEMORY DEVICE IN WHICH LIMIT CONDITIONS TO THE USAGE OF SHIFT CLOCK SIGNAL ARE DEFINED
摘要
申请公布号	KR100245929(B1)	申请公布日期	2000.03.02
申请号	KR19970029711	申请日期	1997.06.30
申请人	SAMSUNG ELECTRONICS CO, LTD.	发明人	KOO, JA-HYUN;TCHO, JONG-BOK;SHIM, HYUN-SEOP;BANG, JEONG-HO
分类号	G01R31/28;G11C11/401;G11C29/14;G11C29/56;(IPC1-7):G11C29/00	主分类号	G01R31/28
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