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发明名称
METHOD OF TESTING SEMICONDUCTOR MEMORY AND APPARATUS FOR IMPLEMENTING THE METHOD
摘要
申请公布号
KR100239739(B1)
申请公布日期
2000.03.02
申请号
KR19977001234
申请日期
1997.02.26
申请人
ADVANTEST CORP.
发明人
KOBAYASHI, SHINICHI
分类号
G01R31/28;G01R31/319;G01R31/3193;G11C29/00;G11C29/44;G11C29/48;G11C29/56;(IPC1-7):G11C29/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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