| 摘要 |
A non-volatile semiconductor memory includes a ferroelectric memory cell 3 and a voltage detection circuit 2. The voltage detecting circuit 2 monitors the drop of a power supply voltage and cuts off the power supply voltage when it is lower than a prescribed voltage so that the memory cell 3 is not operated. In addition, in response to a control input signal, a control circuit 1 is provided to control the power supply voltage so that it is not cut off even when it is lower than the prescribed voltage. In this configuration, the non-volatile semiconductor memory device can be sufficiently subjected to the screening test for a short time without suffering from stress for a long time.
|
