发明名称 CLEANING OF METAL-ORGANIC MATTER CHEMICAL VAPOR DEPOSITING CHAMBER ON THE SPOT
摘要 PROBLEM TO BE SOLVED: To provide a method for cleaning metallic deposited by-products from the surface of a metal-organic matter chemical vapor depositing(MOCVD) chamber on the spot. SOLUTION: This is a method for cleaning metallic deposited by-products from the surface in an environmental chamber for metal-organic matter chemical vapor deposition(MOCVD) of an integrated circuit(IC) and contains (a) a step in which the metallic deposited by-products on the surface to be cleaned are oxidized, (b) a step in which the hydrolyzed vapor of hexafluoroacetylacetonate(Hhfac) is introduced into the chamber, and the metallic deposited by-products oxidized in the step (a) are volatiled and (c) the metallic deposited by-products volatiled in the step (b) are removed, by which the surface of the chamber can be cleaned without dismantling the chamber.
申请公布号 JP2000064049(A) 申请公布日期 2000.02.29
申请号 JP19990037914 申请日期 1999.02.16
申请人 SHARP CORP;SHARP MICROELECTRONICS TECHNOL INC 发明人 TSUE NGUYEN;LAWRENCE J CHERNESKY
分类号 H01L21/00;C23C16/18;C23C16/44;C23C16/50;C23C16/505;C23C16/513;H01L21/285;(IPC1-7):C23C16/44 主分类号 H01L21/00
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