发明名称 |
CLEANING OF METAL-ORGANIC MATTER CHEMICAL VAPOR DEPOSITING CHAMBER ON THE SPOT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for cleaning metallic deposited by-products from the surface of a metal-organic matter chemical vapor depositing(MOCVD) chamber on the spot. SOLUTION: This is a method for cleaning metallic deposited by-products from the surface in an environmental chamber for metal-organic matter chemical vapor deposition(MOCVD) of an integrated circuit(IC) and contains (a) a step in which the metallic deposited by-products on the surface to be cleaned are oxidized, (b) a step in which the hydrolyzed vapor of hexafluoroacetylacetonate(Hhfac) is introduced into the chamber, and the metallic deposited by-products oxidized in the step (a) are volatiled and (c) the metallic deposited by-products volatiled in the step (b) are removed, by which the surface of the chamber can be cleaned without dismantling the chamber.
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申请公布号 |
JP2000064049(A) |
申请公布日期 |
2000.02.29 |
申请号 |
JP19990037914 |
申请日期 |
1999.02.16 |
申请人 |
SHARP CORP;SHARP MICROELECTRONICS TECHNOL INC |
发明人 |
TSUE NGUYEN;LAWRENCE J CHERNESKY |
分类号 |
H01L21/00;C23C16/18;C23C16/44;C23C16/50;C23C16/505;C23C16/513;H01L21/285;(IPC1-7):C23C16/44 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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