发明名称 DEAPROM and transistor with gallium nitride or gallium aluminum nitride gate
摘要 A floating gate transistor has a reduced barrier energy at an interface between a gallium nitride (GaN) or gallium aluminum nitride (GaAlN) floating gate an adjacent gate insulator, allowing faster charge transfer across the gate insulator at lower voltages. Data is stored as charge on the floating gate. The data charge retention time on the floating gate is reduced. The data stored on the floating gate is dynamically refreshed. The floating gate transistor provides a dense and planar dynamic electrically alterable and programmable read only memory (DEAPROM) cell adapted for uses such as for a dynamic random access memory (DRAM) or a dynamically refreshed flash EEPROM memory. The floating gate transistor provides a high gain memory cell and low voltage operation.
申请公布号 US6031263(A) 申请公布日期 2000.02.29
申请号 US19970902098 申请日期 1997.07.29
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES, LEONARD;AHN, KIE Y.
分类号 G11C16/04;H01L27/108;H01L29/423;H01L29/43;H01L29/788;(IPC1-7):H01L29/06 主分类号 G11C16/04
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