发明名称 Surface machining method and apparatus
摘要 A wafer is rotated on its axis, which is biased with regard to an axis of a grinding wheel, and revolves around an axis which is biased with regard to the axis of the wafer and the axis of the grinding wheel. In this state, the grinding wheel is abutted against the surface of the wafer. Thus, all abrasive grains on the grinding wheel can act on the whole surface of the wafer.
申请公布号 US6030278(A) 申请公布日期 2000.02.29
申请号 US19980088777 申请日期 1998.06.02
申请人 TOKYO SEIMITSU CO., LTD. 发明人 HONDA, KATSUO
分类号 B24B7/04;B24B7/16;B24B7/22;(IPC1-7):B24B5/01 主分类号 B24B7/04
代理机构 代理人
主权项
地址