发明名称 FORMING METHOD AND DEVICE OF III NITRIDE SEMICONDUCTOR FILM
摘要 PROBLEM TO BE SOLVED: To enable a III nitride mixed crystal film prescribed in a mixed crystal ratio and uniform in quality to be formed being less affected by a parasitic reaction by a method wherein ammonia gas and organic gallium gas are previously mixed together, guided toward a substrate, mixed with organic aluminum gas in the vicinity of the substrate, and then fed onto the substrate. SOLUTION: Trimethyl aluminum(TMA) and trimethyl gallium(TMG) as III raw material are diluted with carrier gas and transferred into a flow channel 8 through a first gas inlet tube 11 and/or a second gas inlet tube 12. Ammonia (NH3) as III raw material is introduced into the flow channel 8 through a third gas inlet tube 13. A sapphire substrate 4 is placed on a graphite susceptor 3, and the susceptor 3 is high frequency-heated by an RF coil installed on a quartz reaction outer tube 14 circular in cross section. TWG, TMG, and NH3 are heated on the substrate, and an AlGaN crystal film is deposited on the substrate 4.
申请公布号 JP2000058458(A) 申请公布日期 2000.02.25
申请号 JP19980224890 申请日期 1998.08.07
申请人 PIONEER ELECTRON CORP 发明人 OTA HIROYUKI;WATANABE ATSUSHI
分类号 C23C16/34;C23C16/44;C23C16/455;H01L21/205;H01L33/32 主分类号 C23C16/34
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