发明名称 METHOD AND DEVICE FOR MEASURING MAGNETIC DOMAIN CONTROL BIAS MAGNETIC FIELD OF MAGNETO-RESISTANCE EFFECT ELEMENT
摘要 PROBLEM TO BE SOLVED: To measure correctly and precisely a magnetic domain control bias magnetic field by applying a measuring magnetic field to the direction parallel to the magnetic domain control bias magnetic field, measuring aρ-H loop of an MR element and obtaining a shifted amount of this loop. SOLUTION: When the magnetic fields 50, 51 generated by a sense current Is are applied to a free layer 20 and a spinned layer 22, and when aρ-H loop measuring magnetic field is zero, the free layer 20 and the spineed layer 22 are magnetized respectively in the directions 52, 53. In such a manner, when theρ-H loop having no vertical bias magnetic field is measured, it becomes a symmetric shape when magnetic field intensity is zero. When a prescribed measuring magnetic field is applied, and theρ-H loop is measured, the loop becomes a shape shifted in the magnetic field intensity direction, and the absolute value H1 of the positive pole side of the magnetic field intensity and the absolute value H2 of the negative pole side become different values from each other when an output resistance value of a spin valve MR element becomes a prescribed value, and the shifted amount because equivalent to its half (H1-H2)/2, and this shifted amount is equivalent to the vertical bias magnetic field.
申请公布号 JP2000057540(A) 申请公布日期 2000.02.25
申请号 JP19980237959 申请日期 1998.08.11
申请人 TDK CORP 发明人 SHIMAZAWA KOJI;ARAKI SATORU
分类号 G11B5/39;G01R33/09;G11B5/00;G11B5/455;(IPC1-7):G11B5/39 主分类号 G11B5/39
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