发明名称 MANUFACTURING METHOD OF ELECTRONIC COMPONENT
摘要 PURPOSE: An etching method of an upper and a lower layer is provided to reduce the analysis of H¬2O¬2, to control or maintain the temperature of the etching solution mixture and to minimize or reduce all of the re-evaporation of the Pb and the undercut of the whole metallizing stack. CONSTITUTION: The manufacturing method of a semiconductor is formed by the steps of: arraying an upper metal layer(502) made by soldering on a lower metal layer(201, 202) made up of titanium or tungsten; and selectively etching the lower metal layer(201, 202) to the upper metal layer(502) with an etching mixture(601) including an etching solution, an adding agent for controlling the temperature of the etching mixture(601) and other adding agent for reducing the re-evaporation of the upper layer(502).
申请公布号 KR20000011968(A) 申请公布日期 2000.02.25
申请号 KR19990030306 申请日期 1999.07.26
申请人 MOTOROLA INC. 发明人 ULSH ERIC J.;MITCHELDER GLASS Z.;CARNY GEORGE F.;CARNY FRANCES J. JOUNIOR;PAWELL CARREY B.
分类号 H01L21/768;C01B15/037;C23F1/26;H01L21/306;H01L21/308;H01L21/3213;H01L21/60 主分类号 H01L21/768
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