| 摘要 |
<p>PROBLEM TO BE SOLVED: To easily confirm the presence/absence of a problem that data is judged incorrectly without actually testing a semiconductor integrated circuit apparatus having a memory part with setting a source voltage, a temperature or the like condition. SOLUTION: In the semiconductor integrated circuit apparatus which has a memory part 3 having many memory cells for storing data in each memory cell, a decoder part 2 for selecting one memory cell according to an address signal, and a sense amplifier part 4 for amplifying and reading out data stored in the designated memory cell, a judgment voltage-changing means for changing setting of a data judgment voltage is arranged to the sense amplifier part. In a test operation, the judgment voltage-changing means is driven in accordance with a test signal, thereby changing to make a judgment margin smaller than in a normal operation.</p> |
