| 摘要 |
PROBLEM TO BE SOLVED: To shorten device test time concerning the threshold of a semiconductor integrated circuit using a reference voltage as a threshold of circuit characteristic. SOLUTION: To a semiconductor integrated circuit having a first circuit 3 using a reference voltage selected via a feedback loop as a threshold of circuit characteristic and a second circuit 4 capable of outputting the result of operation executed differently from the first circuit by way of output switches S8 to S12 from a buffer circuit 40 to an external terminal 41, a monitor switch S7 selectively conducting the reference voltage selected in the first circuit is provided. Synchronizing with the on state monitor switch S7, the selected state of the reference voltage by the first circuit can be determined corresponding to the state of the first external input terminals 34 and 45 of the first circuit and the second circuit output switch is controlled to off state.
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