BIST CIRCUIT USED FOR LARGE SCALE INTEGRATED MEMORY

摘要

PURPOSE: A BIST circuit used for LSI(large scale integrated) memory is provided to reduce manufacturing cost without extensive external tester by having self-repairing functions. CONSTITUTION: The BIST circuit comprises a repairing code generating register(7) for generating and storing the repairing code about redundancy memory cell used instead of an error memory cell if comparing results from a comparator(3) exist the error memory cell; a selector(6) for selectively outputting data in the repairing code generating register(7) and a GO/NG register(4); and a self-repairing circuit(8) for repairing the error memory cell according to the repairing code.