发明名称 PRODUCTION METHOD OF SOI WAFER AND SOI WAFER PRODUCED THEREBY
摘要 PURPOSE: A SOI wafer production method is provided to reduce production cost of wafer with uniform thickness of the film by forming a silicon film on the SOI wafer. CONSTITUTION: The SOI wafer is produced in the process of: step 1, preparing two silicon mirror wafers(20)(21) and treating the wafer to a thermal oxidation, forming an oxide film(30) on the surface, injecting a hydrogen ion or a gas ion and forming a fine bubble layer(40); step 2, sticking tight a wafer(21) with an oxide film(30) and performing a heat treatment for de-lamination to separate an upper silicon layer from the lower SOI wafer(10). By thermo treating a tight stuck wafer in 1050°C-1200°C an adhering strength is improved.
申请公布号 KR20000011406(A) 申请公布日期 2000.02.25
申请号 KR19990026311 申请日期 1999.07.01
申请人 SHIN-ETSU HANTOTAI K.K. 发明人 YOKOKAWA ISAO;DATE NAOTO;MITANI KIYOSI
分类号 H01L21/02;H01L21/34;H01L21/762;H01L27/12;(IPC1-7):H01L21/34 主分类号 H01L21/02
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