发明名称 |
METHOD AND APPARATUS FOR MEASURING PLASMA DENSITY INFORMATION AND PROBE |
摘要 |
PURPOSE: A method and apparatus for measuring plasma density information and probe used for the method in a plasma used in a thin-film manufacturing process, a particle beam source or an analysis apparatus are provided to measure a plasma density information simply in a long term. CONSTITUTION: A plasma density information measuring apparatus consists of a measuring probe(12) installed on the wall of chamber(1) and a probe control unit(13) installed on the exterior of a chamber(1). The measuring probe(12) comprises:a dielectric tube(14) of which the internal layer is sealed and the external layer is opened to the ambient air; a loop antenna(15) which radiates high frequency power; a coaxial cable(16) which is connected to the loop antenna(15) and transmits high frequency power to the loop antenna(15); and an aluminum conductor chip(17) which prevents a leakage of released electronic wave.
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申请公布号 |
KR20000011784(A) |
申请公布日期 |
2000.02.25 |
申请号 |
KR19990028921 |
申请日期 |
1999.07.16 |
申请人 |
NISSAN INC.;THE PRESIDENT OF NAGOYA UNIVERSITY |
发明人 |
SGAI HIDEO;TAKAS GASEICHI;TOYO DANAOKI |
分类号 |
H01L21/302;C23C14/34;G01N22/00;H01J37/32;H01L21/3065;H05H1/00;H05H1/46;(IPC1-7):G01N22/00 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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