发明名称 OPTICAL DISPLACEMENT MEASURING APPARATUS
摘要 PURPOSE: An optical displacement measuring apparatus is provided to detect a position by high resolution. CONSTITUTION: A pseudo-interference light is frost-deposited on a grid plane of a diffraction grid(1), a diffraction light(Lb) is frost-deposited on a light receiving plane of light receiving element(3), simultaneously. A plurality of lengths of the diffraction lights(Lb) passed via a opening scope of a second frost-deposing portion are the same. A frost-depositing position of the light receiving plane is not changed even if optic axis is crossed. A position detector compute a phase difference of two diffraction lights and detects a relative moving position of the diffraction grid.
申请公布号 KR20000011403(A) 申请公布日期 2000.02.25
申请号 KR19990026308 申请日期 1999.07.01
申请人 SONY PRECISION TECHNOLOGY INC. 发明人 KURODA AKIHIRO
分类号 G01B11/00;G01D5/38;(IPC1-7):G01B11/00 主分类号 G01B11/00
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