发明名称 |
OPTICAL DISPLACEMENT MEASURING APPARATUS |
摘要 |
PURPOSE: An optical displacement measuring apparatus is provided to detect a position by high resolution. CONSTITUTION: A pseudo-interference light is frost-deposited on a grid plane of a diffraction grid(1), a diffraction light(Lb) is frost-deposited on a light receiving plane of light receiving element(3), simultaneously. A plurality of lengths of the diffraction lights(Lb) passed via a opening scope of a second frost-deposing portion are the same. A frost-depositing position of the light receiving plane is not changed even if optic axis is crossed. A position detector compute a phase difference of two diffraction lights and detects a relative moving position of the diffraction grid.
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申请公布号 |
KR20000011403(A) |
申请公布日期 |
2000.02.25 |
申请号 |
KR19990026308 |
申请日期 |
1999.07.01 |
申请人 |
SONY PRECISION TECHNOLOGY INC. |
发明人 |
KURODA AKIHIRO |
分类号 |
G01B11/00;G01D5/38;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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