发明名称 Temperature control system for semiconductor processing facilities
摘要 The present invention generally provides a system for controlling the temperature of multiple components of a semiconductor processing device or fabrication facility. The system includes a common source of a heated or chilled fluid that is distributed to multiple process components for use in heating or cooling. The multiple process components may be part of the same chamber or process, serve different processes in the same or different cluster tool, serve a combination of stand-alone and cluster tools, or any combination of process components located in a common fabrication facility. Each process component includes a flow control valve that controls the temperature of each component.
申请公布号 US6026896(A) 申请公布日期 2000.02.22
申请号 US19970835985 申请日期 1997.04.10
申请人 APPLIED MATERIALS, INC. 发明人 HUNTER, REGINALD
分类号 H01L21/00;(IPC1-7):F24F3/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利