发明名称 WAFER POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To easily work out a countermeasure on the occurrence of a polishing failure by easily locating a head used for polishing a manufactured wafer in question. SOLUTION: In the wafer polishing device, a head rotary mechanism is provided with wafer-holding heads 29 at positions facing the surface of a platen and run in parallel with a polishing pad, and arranged at spaced intervals around the revolving shaft of a carousel 34. The head rotary mechanism is provided with a rotary position detecting means 49 for detecting the positions of the wafer-holding heads 29 relative to the revolving shaft of the carousel 34.
申请公布号 JP2000052240(A) 申请公布日期 2000.02.22
申请号 JP19980218373 申请日期 1998.07.31
申请人 MITSUBISHI MATERIALS CORP 发明人 KAJIWARA JIRO;SHIBATANI HIROSHI;HOSOKI KANJI;FUJIMOTO KENJI;ADACHI HITOSHI
分类号 B24B37/04;B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/04
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