发明名称 |
WAFER POLISHING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To easily work out a countermeasure on the occurrence of a polishing failure by easily locating a head used for polishing a manufactured wafer in question. SOLUTION: In the wafer polishing device, a head rotary mechanism is provided with wafer-holding heads 29 at positions facing the surface of a platen and run in parallel with a polishing pad, and arranged at spaced intervals around the revolving shaft of a carousel 34. The head rotary mechanism is provided with a rotary position detecting means 49 for detecting the positions of the wafer-holding heads 29 relative to the revolving shaft of the carousel 34. |
申请公布号 |
JP2000052240(A) |
申请公布日期 |
2000.02.22 |
申请号 |
JP19980218373 |
申请日期 |
1998.07.31 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
KAJIWARA JIRO;SHIBATANI HIROSHI;HOSOKI KANJI;FUJIMOTO KENJI;ADACHI HITOSHI |
分类号 |
B24B37/04;B24B37/30;B24B37/32;H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|