发明名称 ETCHING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an etching method in which etching residue is less liable to occur. SOLUTION: A resist 32 is formed on the top of a molybdenum layer 17. An etching soln. is diluted to 30-50% and the surface of the molybdenum layer 17 is washed with the etching soln. diluted to such a degree as not to etch the layer 17 for >=60 sec to remove an oxidized film 42 on the surface of the layer 17. The molybdenum layer 17 is then immersed in the etching soln. for conventional wet etching while keeping a metal of a different kind in contact with the layer 17. Aluminum which is baser than molybdenum is selectively etched by a battery effect. Since the surface of the molybdenum layer 17 is previously washed with the diluted etching soln., the molybdenum is uniformly etched and insular etching residue does not occur.</p>
申请公布号 JP2000054163(A) 申请公布日期 2000.02.22
申请号 JP19980221798 申请日期 1998.08.05
申请人 TOSHIBA CORP 发明人 KAKIGI MASAMI
分类号 G02F1/13;C23F1/00;G02F1/1343;G02F1/136;G02F1/1368;H01L21/306;(IPC1-7):C23F1/00;G02F1/134 主分类号 G02F1/13
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